Struct_writer.ino

Sketch path: examples/Struct_writer/Struct_writer.ino

Purpose

Stress-test struct persistence across repeated erase/write/read cycles.

Exact API Calls Used

• flash.getCapacity()
• flash.eraseSection(_addr, sizeof(configurationIn))
• flash.writeAnything(_addr, configurationIn)
• flash.readAnything(_addr, configurationOut)

Loop Behavior

• runs NUMBEROFREPEATS iterations (default 100)
• tracks eraseCount, writeCount, errorCount, readCount
• prints final aggregate summary

Expected Output (Sample)

Initialising Flash memory..........
1
2
3
...
100

----------------------------------------------------------------
                Final results
----------------------------------------------------------------
No. of successful erases:          100
No. of successful writes:          100
No. of errors generated:           0 (errorCheck function failures)
No. of successful reads:           100

What Success Means

• successful counts are close to NUMBEROFREPEATS
• error count stays 0 or near zero (if hardware is stable)

Common Mistakes

• changing struct layout without migration strategy
• assuming one successful run proves long-term stability
• erasing insufficient bytes when adapting struct size